Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
نویسندگان
چکیده
The physical and structural characteristics of pentacene thin films on indium tin oxide (ITO)-coated glass were studied. deposited using the thermal evaporation method with deposition times 20, 30, 60 minutes. Field-emission scanning electron microscopy (FESEM) images revealed that film thickness increased time, a bulk phase layer appearing at presence thin-film corresponding to 15.5 Å lattice spacing was demonstrated by X-ray diffraction (XRD) patterns in 20 30 Meanwhile, time minutes 14.5 Å, existence verified film. Atomic force (AFM) crystallinity ITO-coated exhibited formation similar islands modular grains, results fine crystalline structure. From current-voltage (I-V) current density-voltage (J-V) characteristics, ohmic as pentacene’s decreased. Pentacene an substrate showed potential development broadband narrowband optoelectronic devices transparent substrate.
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ژورنال
عنوان ژورنال: Bulletin of Electrical Engineering and Informatics
سال: 2021
ISSN: ['2302-9285']
DOI: https://doi.org/10.11591/eei.v10i3.3029